OYO Electric Option

  Options for Illuminator System

LAG test option

Effective for afterimage testing

Lower Illuminance Test Option

Effective for 10Lx or lower image testing, Specially Automotive and Medical imaging Sensor devices.

near-IR Test Option

Effective for Near Infrared wave length testing

Stable RGB Option

Managing System RGB ratio rather than Color temperature

Calibration Stabilizer Option

Minimize all illuminator system skews

Pupil Lens module

Meet actual application use model, Simulate device oriented CRA curb.

Others

For test hous

  Available to integration Test System

ADVANTEST T2000-ISS

Nextest iCP Tester

Teradyne IP750 Tester

Teradyne IP750Ex-HD Twin-Docking

Verigy V930000 Tester

Wintest WTS311 Tester

Yokogawa TS60000 Tester

Others, In-House Test System